sdc_hci_cmd_le_iso_read_test_counters()

uint8_t sdc_hci_cmd_le_iso_read_test_counters	(	const sdc_hci_cmd_le_iso_read_test_counters_t *	p_params,
		sdc_hci_cmd_le_iso_read_test_counters_return_t *	p_return )

#include <softdevice_controller/include/sdc_hci_cmd_le.h>

LE ISO Read Test Counters.

The description below is extracted from Core_v6.3, Vol 4, Part E, Section 7.8.113

This command should only be used in the ISO Test mode and only for testing purposes.

The command is used to read the test counters (see [Vol 6] Part B, Section 7) in the Controller which is configured in ISO Receive Test mode for a CIS or BIS specified by the Connection_Handle. Reading the test counters does not reset the test counters.

The Received_SDU_Count, Missed_SDU_Count and Failed_SDU_Count parameters are set in the ISO Receive Test mode (see [Vol 6] Part B, Section 7.2).

Errors:

See Section 4.5.2 for a list of error types and descriptions.

Type   Condition                                                   Error code
MC     Connection_Handle does not identify an established CIS or   Unknown Connection
       a BIS.                                                      Identifier (0x02)
MC     Connection_Handle identifies a CIS or BIS that is not       Unsupported Feature or
       configured in the ISO Receive Test mode.                    Parameter Value (0x11)

Event(s) generated (unless masked away):

When the HCI_LE_ISO_Read_Test_Counters command has completed, an HCI_Command_Complete event shall be generated.

Parameters

[in]	p_params	Input parameters.
[out]	p_return	Extra return parameters.

Return values

0	if success.

Returns

Returns value between 0x01-0xFF in case of error. See Vol 2, Part D, Error for a list of error codes and descriptions.