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Edge AI Add-on API 2.2.0
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#include <nrf_axon_nn_infer_test.h>
Data Fields | |
| nrf_axon_nn_compiled_model_s | base |
| uint8_t | layer_ndx |
| int8_t | input0_layer_ndx |
| int8_t | input1_layer_ndx |
| uint16_t | input_batch_cnt |
| uint16_t | output_batch_cnt |
These APIs support test inference on axon neural network models. They are used in the test_nn_inference application, as well as by private Nordic Semiconducotr test code. Test extensions to nrf_axon_nn_compiled_model_test_s to support model layer testing. Each compiled layer model instance produced by the compiler is an instance of nrf_axon_nn_compiled_model_layer_s.